Used KLA / TENCOR FT-750 #9155148 for sale
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Wafer thickness measurement system, 4"-8" Voltage: 115 V Frequency: 50/60 Hz Current: 1250 W 2000 vintage.
KLA / TENCOR FT-750 is a high-precision wafer testing and metrology equipment used for inspecting semiconductor wafers and devices. It provides defect inspection, device measurements, and layer-thickness measurements on a variety of wafer types and sizes including bare, patterned, and packaged devices. KLA FT-750 features a powerful Zeiss optical system with large-area detectors and sub-micron resolution, making it ideal for the challenging tasks of inspecting the most microscopic features of wafers and semiconductor devices. TENCOR FT 750 utilizes a high-speed, high-accuracy beam positioning unit to scan a broad range of features on a wafer or device, including deficiencies, impurities, contaminants, and defects. Additionally, the machine is equipped with a wide variety of automation tools, including vacuum wafer cassettes and automatic alignment tools, for non-stop, automated testing. FT 750's powerful automated multi-parameter metrology tool enables precise determination of film thickness, velocity, and resistivity of layers on wafers and devices. This ensures that the most stringent specifications of high-tech devices are met. Additionally, KLA / TENCOR FT 750 provides state-of-the-art visual inspection capabilities, including optical resolution below 0.5 µm. FT-750 features a host of advanced control technologies, including intuitive software and ergonomic cabinetry. The asset's built-in electronic calibration model simplifies the process of routine calibration and maintenance. This equipment is capable of capturing and analyzing up to 500 parameters at once, making it one of the most powerful and efficient wafer test systems available. In conclusion, KLA FT 750 wafer testing and metrology system offers the highest precision and accuracy available for testing and monitoring the quality of wafers and semiconductor devices. Its powerful automated multi-parameter metrology unit and state-of-the-art visual inspection capabilities ensure the most stringent specifications of high-tech devices are met.
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