Used KLA / TENCOR FT-750 #9185317 for sale

ID: 9185317
Film thickness measurement systems.
KLA / TENCOR FT-750 is a state-of-the-art wafer testing and metrology equipment designed for monitoring the performance and quality of integrated circuits during production. The system is based on optical non-contact technology, providing high accuracy, price-performance, and batch testing capabilities. KLA FT-750 is exceptionally well-suited to advance device and circuit manufacturing processes for opto-electronic and photonic ICs, MEMs sensors, and semiconductor components. TENCOR FT 750 is designed to measure and monitor defects on wafers during production. This is done with the use of its proprietary multi-wavelength backlighting, scanning optics and pixel matrix area imaging, coupling the features of homogeneous and unique measurements for each device. This ensures users can accurately detect any electrical defects such as shorts, opens, broken vias, and shorts to copper, ensuring production quality. Furthermore, KLA FT 750 is capable of quickly and repeatedly scanning and independently measuring an array of parameters in order to identify specific defects and to quickly evaluate process performance. The unit has the capability to measure the parameters of advanced nodes, even up to 7nm and below. It offers inspection accuracy in the smallest of feature sizes, providing fast visual images, and high resolution analytics for a variety of integrated circuit photodetectors, resistors, capacitors, and other components. FT 750 is designed with features for ease-of-use, including user-defined automated tests setups, automatic setup for multiple sensing parameters, standard wafers calibration, and rapid test execution. Additionally, the machine is equipped with comprehensive image analysis tools, such as cross-polarization analysis, high- and low-contrast inspection, topography analysis, intelligent defect classification, and a selection of automatic defect recognition. Moreover, the tool is designed for batch testing, providing a fast and efficient solution for the large volume of production wafers. KLA / TENCOR FT 750 is also well-equipped with advanced software tools that can be used to analyze data in real-time, as well as prepare simple or complex reports. The asset is compatible with various host computer systems and third-party software to further extend users' analysis and reporting capabilities. To sum up, FT-750 is a top-of-the-line wafer testing and metrology model engineered for fast detailed examination and defect recognition of integrated circuits during production. The intelligent automated tools and comprehensive analytics provided by the equipment enable users to detect and monitor defects with accuracy and consistency, and its batch testing capabilities make it an ideal choice for large-scale production.
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