Used KLA / TENCOR FT-750 #9278762 for sale
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ID: 9278762
Wafer Size: 6"
Vintage: 1998
Film thickness measurement system, 6"
1998 vintage.
KLA / TENCOR FT-750 is a wafer testing and metrology equipment designed to deliver highly accurate and reliable metrology data. KLA FT-750 is a compact, multi-user, turn-key system, packed with features and designed to fit in a cleanroom or laboratory environment. TENCOR FT 750 features an integrated upper and lower scan module that provides full site-level wafer testing and metrology of wafers and wafer edge. The unit's self-adjusting optics accommodate wafers up to 8" in diameter with an adjustable focus to ensure even scan surfaces across a wide range of wafer thicknesses. The machine's patented CSAM™ scanning technology detects and displays, at the wafer level, contaminations, scratches, and other surface features down to 2μm in size. The tool also performs Critical Dimension (CD) measurement and process control on reticles and masks as well as profile and roughness measurement capabilities. FT-750 has a number of advantages when compared to other wafer testing systems, including its low cost of ownership, low maintenance requirements, and very high throughput. The asset's user interface is intuitive, and can be easily adapted to meet the user's needs. Additionally, the model's modular design allows users to easily add additional capabilities such as wafer mapping and MIMOS™ metrology. Overall, KLA FT 750 is an excellent choice for customers needing reliable and accurate wafer testing and metrology data. The equipment's compact size, low cost of ownership, and flexibility make it a great fit for a variety of applications. With proven scanning and metrology capabilities, TENCOR FT-750 is an excellent choice for customers looking for a reliable and accurate wafer testing system.
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