Used KLA / TENCOR HRP 340 #293832322 for sale

KLA / TENCOR HRP 340 wafer testing and metrology equipment is an advanced tool that provides reliable wafer and device performance characterization and analysis with unparalleled accuracy and speed. It is designed to effectively measure wafer features ranging from sub-nanometer to sub-micron. The system consists of a highly advanced, automated metrology platform integrated with a robust optical sensing technology to ensure accurate measurements. It is equipped with up to four interchangeable motorized axes, ranging from three-axis configurations to five-axis configurations, making it ideal for use in high volume production. The unit is equipped with a powerful, automated optical pre-characterization feature which quickly locates and measures wafer features of interest. Its high-precision interferometer optics allow for measurements with sub-nanometer resolution, while its flexible motorized calibration mechanism compensates for any environmental and other offsets. The machine is also designed for optimal throughput, with its ability to scan up to 480 wafers in 10 minutes, and features competitive throughputs for almost any combination of feature size and quantity as compared to other automated systems. KLA HRP 340 offers comprehensive and automated reporting capabilities, with the ability to create comprehensive graphs and detailed reports that can be easily shared or exported to other locations. Reports generated by the tool are stored in a consolidated file as an electronic record which can then be referenced for further analysis and review. To ensure proper operation and accuracy, TENCOR HRP 340 is designed with automatic software and hardware diagnostics. It also features an unrestricted, open architecture design for capabilities such as customer defined and tailored test recipes and specialized hardware integration. As a result, HRP 340 wafer testing and metrology asset is an effective and reliable tool for accurately measuring wafer features ranging from sub-nanometer to sub-micron. Its comprehensive reporting capabilities and automated diagnostics ensure optimized test and reporting quality and accuracy.