Used KLA / TENCOR HRP 340 #9219036 for sale

KLA / TENCOR HRP 340 is a state-of-the-art wafer testing and metrology equipment. It is designed to provide a secure, accurate and efficient metrology solution for multiple substrate applications. KLA HRP 340 is a multi-functional system that combines numerous tools, from wafer probers to defect review systems, under one flexible platform. The unit offers a wide range of metrology capabilities for various wafer tests, including wafer prober(s), microscopes, vision systems, laser induced breakdown spectroscopy (LIBS), atomic force microscopy (AFM), scanning electron microscopy (SEM), and other advanced metrology solutions. The machine is capable of detecting and sorting defects on the wafers in order to identify failure locations. It also offers precision alignment and imaging at low levels of critical dimension (CD). TENCOR HRP 340 provides high resolution imaging with a reduction in patterning steps. The featured FIB/SEM tool simplifies sample prep and increases the number of potential die-level views. The tool's advanced image enhancement technology enables edges and patterns of any shape to be accurately identified and measured, ensuring high-fidelity defect detection. The included vision systems are integrated with specialized machine-learning algorithms that can quickly detect even the smallest defects. HRP 340 is outfitted with a variety of advanced probe cards to further facilitate accuracy in wafer testing. The cards are designed to significantly reduce biological contamination. This asset provides flexibility, precision, speed, and compatible test methods for a variety of substrates. The automated wafer prober integrated with vision and auto-focus systems allows for efficient sampling through the substrate for increased accuracy and testing stability. In addition to offering comprehensive defect detection, KLA / TENCOR HRP 340 is also equipped with automated defect review tools, ensuring the utmost validity of each result. The automated histogram features provide statistical profiles of numerous wafer tests. These profiles showcase trends in defectivity and allow users to quickly identify type and grade specific associations of failure substrates. KLA HRP 340 is ideal for both research and production applications, and is a top-of-the-line metrology solution within the semiconductor industry.