Used KLA / TENCOR HRP 340 #9261848 for sale

KLA / TENCOR HRP 340 is an advanced wafer testing and metrology equipment that has been designed for high precision measurements of layer thickness, film thickness, flatness, particle size, and defect density in a range of semiconductor manufacturing applications. In a typical semiconductor process, KLA HRP 340 takes precise measurements of the wafer surface in real-time and provides high accuracy results for precise quality control and product improvement. TENCOR HRP 340 measures the thickness of the deposited film on the substrate surface, the flatness of the wafer, the particle size and composition, the presence and density of surface defects, overlay accuracy, electrical characteristics, and other parameters. Additionally, HRP 340 provides timely statistics, analysis, results, and customized reports to allow manufacturers to identify process variations, trends, and anomalies. KLA / TENCOR HRP 340 utilizes innovative technology and engineering to provide superior performance and accuracy. With an optical detection system and a wide dynamic range, KLA HRP 340 can accurately measure and quantify a variety of characteristics in a reliable and consistent manner. TENCOR HRP 340 also features advanced image processing capabilities that allow for more precise measurements and analysis of the wafer. Additionally, the unit features robust automatic-cleaning algorithms that ensure no particle contamination remains on the wafer surface. HRP 340 is a powerful wafer testing and metrology machine with a wide range of applications including advanced semiconductor processes such as three-dimensional NAND cell fabrication. The tool provides highly accurate measurements of key performance characteristics and helps ensure the production of reliable, high-quality semiconductor products. With its advanced optical detection asset, image processing capabilities, and robust cleaning algorithms, KLA / TENCOR HRP 340 enables manufacturers to optimize their processes and maintain control of quality and reliability.