Used KLA / TENCOR HRP 350 #293610085 for sale

KLA / TENCOR HRP 350 Wafer Testing and Metrology Equipment is a next-generation wafer testing and metrology solution. It combines the latest in optical metrology and laser technology to offer the highest levels of accuracy and precision. This system provides reliable measurements of wafer parameters such as thickness, flatness, and coating uniformity. It is also versatile, capable of measuring a wide range of wafer sizes and applications, from MEMS and LED devices to semiconductor circuits. KLA HRP 350 makes use of an advanced optical alignment unit, allowing for fast and repeatable measurements. This ensures that the machine can accurately detect even the slightest variations in wafer parameter values. The tool is designed to quickly switch between different measurement modes and have the ability to support a variety of wafer types, such as silicon, GaAs, and quartz. TENCOR HRP-350 is a high-throughput asset, capable of simultaneously testing up to 24 wafer samples. This saves time and cost, as the model can be quickly changed to accommodate larger lot sizes. Additionally, TENCOR HRP 350 can be configured to work with a range of accessories, such as a vision-based sample recognition equipment, to further automate sample processing. In addition to the optical metrology capability, HRP-350 offers laser-profiling capabilities, allowing for detailed surface characterization of wafers. This includes the ability to measure surface height and roughness values. KLA / TENCOR HRP-350 is also equipped with a unique profiling system for measuring through-the-thickness variation. KLA HRP-350 is also suitable for a wide range of defect detection applications. A defect-detection camera is included to identify surface defects and monitor any out-of-spec elements. This camera also makes use of advanced analysis algorithms to accurately describe the defects, such as size and shape characteristics. Overall, HRP 350 Wafer Testing and Metrology Unit is a complete solution for measuring and characterizing a wide range of wafer parameters and defects. The advanced optical alignment, high-throughput capability, and versatile accessory options make KLA / TENCOR HRP 350 an excellent choice for any wafer and semiconductor testing and metrology application.