Used KLA / TENCOR HRP 350 #9407208 for sale

KLA / TENCOR HRP 350 is a high-performance, automated wafer testing and metrology tool that serves a wide range of applications in the semiconductor industry. It offers high-end optical and electrical wafer testing, along with advanced control, analysis and reporting capabilities. KLA HRP 350 is a fast, highly accurate and reliable tool, capable of collecting incredibly detailed wafer data that can be stored or used for further analysis. The equipment features an advanced optical inspection system with a laser-based, scanning microscope that can collect imaging data of a wide range of properties, including topography and particle density. Data can be collected from inline, off-line or post-inspection operations. Furthermore, TENCOR HRP-350 provides users with the ability to automatically control wafer surface characteristics after post-processing operations. It allows for the review of different operations and metrics, such measurements for diameter, overlap and layer thickness. The unit also features a powerful electrical test machine that is designed to analyze the electrical characteristics of die and bond pads, using a variety of techniques, ranging from pulsed current and resistivity measurements to capacitance testing. It also offers automated electrical failure analysis, including voltage compliance testing, which is used to identify short and open circuits. TENCOR HRP 350 includes advanced software tools that provide users with powerful tools and analytical capabilities. These include automated report generation and reporting features, which generate highly detailed reports and data summaries. Additionally, it features a robust work flow interface that provides users with the ability to configure, monitor and manage all tool functions, including test scheduling, statistical analysis and operator reporting. Overall, KLA HRP-350 is an invaluable tool for those tasked with accurately testing and analyzing wafer data. It includes advanced optical and electrical test and reporting functions, making it an essential part of any wafer testing and metrology program.