Used KLA / TENCOR / ICOS T830I #9378053 for sale

KLA / TENCOR / ICOS T830I is a state of the art wafer testing and metrology equipment designed to meet the industry standards in semiconductor device testing. It is equipped with a patented blue laser inspection system that scans and inspects wafers using sub-micron imaging to detect any defect present in the wafer material. By combining infrared (IR) and multispectral imaging, the unit can detect both optical and electro-optic features of the tests objects, presenting users with a comprehensive wafer analysis solution. KLA T830I is designed for high-volume production, offering fast batch times and automated testing processes. It also features an upgradeable firmware to ensure its compatibility with other systems in KLA lineup. With a dedicated Software package, ICOS T830I has the capability to detect and analyze a variety of wafer issues such as foot-print, CD uniformity, dopant concentration, overlay, and pattern defects. Further, the machine offers advanced defect detect and classification capabilities, allowing device manufacturers to better understand and eradicate defects, errors, or contaminants on wafer material. It also provides etch profiling capabilities, enabling users to examine and determine the thickness and density of wafers. In addition, the tool offers a platform for user process characterization, allowing for in-depth analysis of device features and manufacturing processes. To simplify asset operation and maintenance, the device comes with an ergonomic GUI (Graphical User Interface). The intuitive user interface provides various control and visualization tools to improve overall model workflows and enhance quality control processes. Level 1 and 2 equipment activities may be handled through the system's touch screen, while Level 3 unit functions may be operated via the workstation component of the machine. T830I is an ideal solution for semiconductor device manufacturers looking to increase production yield and reduce costs. Its powerful combination of wafer testing and metrology features makes it a great choice for those who require fast, consistent, and reliable results.