Used KLA / TENCOR MICROXAM 100 #293658255 for sale

KLA / TENCOR MICROXAM 100 is an advanced optical microscope ideal for microelectronics failure analysis and high resolution wafer inspection. This system combines high performance optics, advanced imaging components, and precision mechanics to create a powerful and versatile microscope. KLA MICROXAM 100 features a large field of view, optical zoom capability, and a variable magnification range of up to 5,000X. It is also equipped with an 8" liquid crystal display that offers exceptional image clarity and resolution. The microscope also features custom designed objectives, including a Plan Apochromat lens, which allows for high resolution imaging of a variety of features from submicron lines down to nanostructures. TENCOR MICROXAM 100 incorporates a dual-axis stage for precision sample alignment. The stage offers a 20 micron accuracy for scanning capabilities and can be easily recalibrated, if necessary. It also has a fast video acquisition (Frames Per Second) rate, allowing for high speed imaging and analysis of dynamic samples. To provide detailed imaging and analysis, MICROXAM 100 comes with an integrated LED illumination system. KLA Smart Tec™ LED array allows the user to control the intensity of the light beam, providing uniform illumination and minimized distortions. KLA / TENCOR MICROXAM 100 is able to capture a variety of image formats, including high definition stills and video formats. The microscope is also compatible with multiple software solutions, allowing the user to customize their setup according to their imaging requirements. It is also capable of performing traceable measurements and repeatable analysis. KLA MICROXAM 100 is a reliable and powerful microscope for high resolution imaging and analysis of microelectronic devices. Its combination of high performance optics, advanced imaging components, precision mechanics, and LED illumination, allows the user to confidently capture and analyze a variety of features. Its performance and versatility make it the ideal choice for microelectronic failure analysis and wafer inspections.