Used KLA / TENCOR Omnimap RS75 / TC #9159115 for sale

KLA / TENCOR Omnimap RS75 / TC is a wafer testing and metrology equipment designed to analyze semiconductor wafers at the nanometer level and provide high-accuracy results for process development, process optimization, and defect discovery. The RS75 / TC system is capable of collecting and providing ultra-high accuracy, high-speed, and multi-surface imaging. It uses advanced optics and high-precision stages to create images with auto-focusing, and then captures these images using a CMOS detector. This allows for precise measurement of surface profiles, defects, particle counts, and various other characteristics of the wafer. The unit features a high-speed stage to rapidly move the samples across the imaging area, allowing for high throughput and realistic measurements. It also has an intuitive touchscreen interface which makes it easy for users to quickly set the correct measurement parameters. The machine is also highly automated, making it easy to use and providing quick results. Moreover, the RS75 / TC tool is equipped with an ultra-high sensitivity metrology detector (UHSM) that can detect changes in film thickness, composition, and other physical properties of the sample. This detector also provides a powerful array of analytical tools to facilitate process optimization. In addition, the asset also comes with an exclusive imaging software suite, KLA Automap, which is designed to quickly assess sample surface profiles. It has the ability to measure slopes, roughness, and sections, which can be used to determine process conditions. Other features of this software include template design and user modification support for more precise measurements. Finally, KLA Omnimap RS75 / TC is designed for use in a wide variety of applications, such as for mapping micro-scale morphologies, surface defect, weak-point identifications, defect characterization, and much more. The device is perfect for process development, process optimization, and defect discovery, providing high-accuracy, high-speed and high-throughput measurements.