Used KLA / TENCOR Optiprobe 3260 #9269305 for sale

KLA / TENCOR Optiprobe 3260 is a state-of-the-art wafer testing and metrology equipment designed for advanced quality and process control. KLA Optiprobe 3260 supports an array of wafer parameters such as surface topography, micro defects, as well as automated defect classification. TENCOR Optiprobe 3260 utilizes scanning probe microscopy to measure the surface topology of the wafer. The system includes a shuttered sensor that can detect particles smaller than 5μm in diameter. By using optical microscopy, the unit is able to inspect for micro defects or damage in the wafer. The machine also includes advanced optics for high-resolution image scanning and analysis. Optiprobe 3260 includes a superior probe tool that uses high-accuracy inspection to examine a wide range of patterns. The asset also has a proprietary Digital Defect Classification (DDC) algorithm to automatically classify any identified defects according to their size and shape, as well as allow for advanced process control. In addition, KLA / TENCOR Optiprobe 3260 has a proprietary overlay model that accurately measures the overlay accuracy of wafers. KLA Optiprobe 3260 includes advanced pattern recognition and defect reduction technologies to greatly reduce false alarms and to shorten test cycle time. The equipment also has automated tester software that enables manufacturers to quickly program and run tests to obtain the best possible results. For high-throughput production, TENCOR Optiprobe 3260 has a fast-toggling sensor that allows manufacturers to maintain quality and throughput even at high throughput conditions. In addition, the system has advanced data analysis and reporting capabilities, allowing for precise comparison of wafers during test cycles and further enabling automated process control. Optiprobe 3260's data analysis and reporting features include the ability to index and compare wafers, as well as the ability to ascertain yield and process efficiency metrics. The unit also provides custom reporting that is tailored to the customer's specific needs. KLA / TENCOR Optiprobe 3260 meets the highest standards for wafer testing and metrology. The unique combination of advanced hardware, proprietary algorithms, and robust data analysis/reporting capabilities ensures that manufacturers receive best-in-class performance testing and optimization.