Used KLA / TENCOR Optiprobe 3260 #9269306 for sale

KLA / TENCOR Optiprobe 3260
ID: 9269306
Film thickness measurement system.
KLA / TENCOR Optiprobe 3260 wafer testing and metrology equipment is designed to help semiconductor manufacturers achieve the highest levels of chip performance and reliability. KLA Optiprobe 3260 offers an unprecedented set of features to enable chipmakers to quickly test and analyze the performance of their next-generation devices. TENCOR Optiprobe 3260 is a powerful and versatile wafer tester and metrology system. It is equipped with a proprietary optical inspection technology called "Optical Pattern Analysis," which allows wafers to be inspected and analyzed for defects at a higher level of precision than ever before. The unit can be used for both optical and electrical wafer testing and metrology. Optiprobe 3260 integrates an array of advanced features to improve and streamline the chip testing process. It includes its own proprietary metrology, such as optical probobility measurements and built-in testing capabilities such as parametric test for critical device parameters. The machine also offers improved accuracy with ultra-low noise levels and a higher throughput with its fast test vectors. In addition, KLA / TENCOR Optiprobe 3260 offers various features to improve the chip design process. The tool includes an advanced library of standard manufacturing rules that can be used to ensure the chips are produced with very high yield rates. It also offers an integrated silicon review capability to inspect the entire wafer for critical manufacturing defects. KLA Optiprobe 3260 also includes a host of other features to improve the overall chip production process. These include an advanced calibration library, capable of significantly reducing the time it takes to calibrate the asset, and a versatile carousel model allowing for easy access and utilization of all the testing modules in the equipment. TENCOR Optiprobe 3260 delivers improved performance and reliability, faster chip production times, and better chip yield rates. It is an ideal solution for semiconductor manufacturers looking to test and analyze their chips in the most accurate and cost-effective manner possible.
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