Used KLA / TENCOR Optiprobe 3290 #9269307 for sale

KLA / TENCOR Optiprobe 3290
ID: 9269307
Film thickness measurement system.
KLA / TENCOR Optiprobe 3290 is a wafer testing and metrology equipment that can measure and analyze the properties of various wafers, such as thickness, resistivity, micro-cracks, topography, film thickness, and more. The system is designed to extend the volume of wafers tested while providing accurate measurements through its high- resolution optics. KLA Optiprobe 3290 utilizes a multi-frequency Electromagnetic Interference (EMI) scanning technology that can measure a variety of wafer parameters even in the presence of reflected sources. Additionally, the unit is equipped with an innovative light-direction feedback machine that significantly improves measurement precision. TENCOR Optiprobe 3290 has two optional subsystems—an Autodisk and a Motorized Stage. The Autodisk allows users to quickly and accurately position wafers in the tool, and the Motorized Stage enables researchers to quickly and accurately measure films of any thickness. The asset features a high-speed stepper motor that allows the model to scan multiple locations on a wafer simultaneously. Optiprobe 3290 also comes with a comprehensive data storage and analysis software package. The software allows researchers to control and analyze all the data gathered from the equipment. KLA / TENCOR Optiprobe 3290 is a versatile, easy-to-use wafer testing and metrology system designed to measure and analyze a variety of wafer parameters. The unit is suitable for use in a wide range of research and industrial applications. With its advanced EMI scanning capabilities, high-level data storage and analysis software package, and optional subsystems, KLA Optiprobe 3290 offers researchers an efficient and accurate way to characterize wafer properties.
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