Used KLA / TENCOR P15 #9407612 for sale

KLA / TENCOR P15 Wafer Testing and Metrology Equipment is a sophisticated semiconductor quality assurance system designed to accurately test and measure the features and performance of semiconductor wafers. It is capable of inspecting silicon while it is still in substrate form, as well as after it has been diced into individual integrated circuits. The unit features an inspection microscope that utilizes image recognition technology and advanced algorithms to analyze wafers. The user is provided with a detailed report of defects and their characteristics that have been highlighted throughout the images. The built-in metrology machine is capable of performing measurements on individual dies, with a data reporting accuracy of 1 nanometer. KLA P-15 utilizes a scanning electron beam that is consistent and repeatable with a resolution down to 2 microns. This allows for high precision thinning, as well as efficient and accurate analysis of defects such as particle contaminants, as well as stains, dust, and conductivity. The tool offers several unique features that make it highly accurate and efficient compared to its counterparts. Its unique crossbeam technology allows for a simultaneous view of both the top and bottom of the wafer, making it up to 30 times faster than traditional single beam scanning microscopes. TENCOR P 15 also boasts an advanced back scatter electron (BSE) imaging model, which increases the accuracy of all defect measurements significantly. TENCOR P15's automatic defect grading asset classifies all detected defects into four levels - low, medium, high, and critical - depending on the severity. This allows user pre-defined actions to be triggered automatically such as a warning, stop or continue inspection, or advanced metrology functions. P-15 comes standard with a comprehensive suite of software for comprehensive wafer test and metrology. A variety of different measurements can be analyzed, including wafer thickness, structure depth and crack depth, as well as profile determination, lamination parameters, and complex pattern analysis. In conclusion, TENCOR P-15 Wafer Testing and Metrology Model is a powerful tool that can be used to efficiently and accurately test and measure the features and performance of semiconductor wafers. Through its advanced imaging technology, built-in metrology equipment, and comprehensive software, KLA P15 is capable of delivering reliable results with unparalleled precision.