Used KLA / TENCOR P-170 #293800460 for sale

KLA / TENCOR P-170 Wafer Testing and Metrology Equipment is a high performance metrology platform that provides accurate, automated measurements and analysis of wafers, semiconductors, and MEMS devices. KLA P-170 features advanced optical metrology capabilities for accurate analysis of device characteristics in the wafer production environment. It offers advanced, non-contact imaging and analysis of devices, providing a reliable method of measuring and quantifying wafer performance. TENCOR P-170 features a motorized wafer stage, an integrated optical subsystem, and an intuitive user interface for easy operation and setup. The motorized stage moves the wafer to a series of positions, accurately and precisely, allowing for analysis of all of the flat areas on the wafer. The optical subsystem is made up of high resolution cameras that can detect the smallest features on the wafer as the stage moves, creating a detailed image of the topography of the wafer. The intuitive user interface allows for fast setup and data entry for an easy workflow. P-170 also features high accuracy positioning and spacer alignment capabilities for areas that are difficult to access. KLA / TENCOR P-170 can measure a wide range of features, including critical parameters that are commonly used in semiconductor manufacturing such as CD and overlay. The system can measure device dimensions with sub-nanometer accuracy, as well as flat area characteristics, allows for fast identification of any possible non-conformance in the fabrication process. KLA P-170 also enables efficient automated sorting and mapping of the devices, simplifying the process of analyzing the wafers in the production line. For an automated production environment, TENCOR P-170 offers advanced capabilities such as AutoFocus, which allows for continuous measurements of CD or composition in as little as 35 seconds. The unit also features high-speed indexing and terrain correction, guaranteeing top-notch uniformity and accuracy in all of its measurements. Moreover, P-170 offers the flexibility to integrate with other tools or parts of the production line, streamlining processes. Overall, KLA / TENCOR P-170 Wafer Testing and Metrology Machine is an all-in-one solution that enables fast, precise and repeatable analysis of wafers, semiconductors, and MEMS devices. With its advanced metrology capabilities, high accuracy measurements, intuitive user interface, and advanced automation, KLA P-170 provides an accurate, efficient method of analyzing wafers in the production environment.