Used KLA / TENCOR P-170 #293800571 for sale

ID: 293800571
Wafer Size: 4"-6"
Vintage: 2021
Surface profiler, 4"-6" Chuck, 8" Cassette, 8" Wafer type: LT / BD / SI SECS / GEM Automatic transfer hander Wafer thickness: 200 µm to 675 µm Alignment for notch and flatted wafers Constant stylus focus control (5) Measurement heads Monitor Dual view optics (top and side) Field of view: 850 x 1200 µm Digital camera: 5 MP Color Motorized level and theta axis Stylus with radius: 2 µm ProCal Wafer, 8" Controller Laser Dongle Operating system: Windows 7 PC Manuals 2021 vintage.
KLA / TENCOR P-170 is a state-of-the-art wafer testing and metrology equipment built to provide highly accurate and repeatable results. It offers semiautomatic operation, with precise manual operation where needed for more refined tasks. The system's high accuracy is due to its ability to measure both die and wafer-level defects on the p-type junction of the device while also providing integrated detailed images for more precise analysis. The unit features a long-working chamber that provides great exposure to light and is capable of handling high-resolution measurements. This chamber is thermally and electronically coupled to the optical machine, resulting in high accuracy and repeatability of measurements. In addition, the tool is equipped with a user-friendly interface that allows for easy editing and managing of results and data. KLA P-170 features a variety of functions designed to test and measure wafers with high accuracy. The asset is capable of die-level mapping, die-level failure analysis, and die-level defect densities. It also offers a low-light mapping mode, allowing the model to record images with the best possible resolution. Additionally, the equipment features line density, die uniformity, defect analysis, overlay metrology, measurement templates, and custom curve corrections. As an added convenience, the system is equipped with a variety of software that can be switched between different versions to create customized programs for wafer testing and metrology. The built-in calibration routines allow for easy setup and use, and the wafer integrity monitor provides quick feedback on any potential issues that may have been missed by the user. In conclusion, TENCOR P-170 is a technologically advanced wafer testing and metrology unit capable of providing highly accurate and repeatable results. The machine is ergonomically designed to enable users to perform complex tests and measurements with ease while still maintaining a high degree of accuracy. The tool also offers several features that make it highly efficient and cost-effective for both research and production operations.
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