Used KLA / TENCOR P-20H #293652635 for sale

KLA / TENCOR P-20H is an advanced wafer testing and metrology equipment that provides high-speed, high-precision wafer testing and metrology capabilities for semiconductor device production. The system is designed for rapid and accurate wafer quality characterization and adaptive process control, enabling the production of high-performance wafer products. It features an extensive range of metrology technology, including optical, electrical, mechanical, and chemical analysis that is designed to enable wafer testing and metrology performance in a wide range of applications. KLA P20H combines advanced imaging technologies and advanced optical, electrical, mechanical, and chemical characterization techniques to identify and analyze defects in wafers. It uses a digital camera to image the wafer and combines focused imaging with variable-angle scatter imaging to provide high-resolution imaging for defect detection, classification, and process optimization. A range of tools are built-in, including automated mapping and defect analysis, overlay alignment, process-monitoring tools, signal processing techniques, and advanced data analysis algorithms. The unit offers automated non-destructive testing (NDT) capabilities, allowing for a high degree of accuracy and repeatability in wafer testing and metrology. The high speed of TENCOR P 20H ensures that wafer testing is accomplished in a rapid fashion, allowing for timely adjustment of production processes. In addition to its NDT capabilities, TENCOR P-20H offers advanced metrology analytics and integrated software packages to enable precise characterization of wafer processes and metrology performance. A wide variety of software packages, such as Metrology Analysis Tool (MAT) and Process Analytic Machine (PAS), are available for metrology analytics. P 20H also offers comprehensive traceability and data archiving. It enables full traceability and data archiving of metrology analyses, which is essential for problem solving and process optimization. KLA P 20 H is an advanced tool that provides comprehensive wafer testing and metrology capabilities. It offers a highly efficient and accurate means of wafer testing and metrology, allowing users to optimize their processes for improved yields and product performance.