Used KLA / TENCOR P-6 #293592892 for sale

KLA / TENCOR P-6 is a next-generation wafer testing and metrology systems designed for high-end semiconductor production applications. The equipment combines the latest technologies for wafer testing and measurement - providing both high precision and high resolution results with short cycle times. The system is capable of probing, testing, measuring and analyzing many different semiconductor materials and devices, including Flash, NOR and NAND memories, logic and radiofrequency Integrated Circuits (RFICs). It features several hardware components, including a configuration-controlled, CCD-based, high resolution 2D optical microscope and an automated XY stage. The microscope includes a Colibri 3200 F2 CCD detector and high quality objectives, providing an ergonomic and user friendly environment to quickly inspect and analyze a large variety of materials and devices. The unit also comes with a library of automated image recognition algorithms that can help to identify different defects. For wafer testing, the machine is equipped with a state-of-the-art parametric testing tool and full ten-pin contactor. The testing asset can perform high-bandwidth measurements in milliseconds. High-speed pattern-programming tools and integrated automatic focus, leveling and product classification tools provide for a robotics-controlled wafer testing. The model also includes an integrated thick energized film strip tool for in-depth analysis of film thickness in areas of interest. This allows for real-time, in-line film thickness measurements to ensure optimal results. KLA P-6 equipment also comes with a turret that can accommodate up to 5 modules and a calibration device to ensure accurate and repeatable testing results. An optoelectronic cable control system allows for automated switching between different litho, CMP and contactor configurations, reducing the cycle time. TENCOR P6 provides one of the most advanced wafer testing and metrology systems available in the industry. Its flexible design, high accuracy and combined testing and metrology capabilities make it the ideal choice for high-end semiconductor manufacturing applications.