Used KLA / TENCOR P-6 #293651885 for sale

KLA / TENCOR P-6 is a leading-edge wafer testing and metrology equipment designed to measure and characterize thin films on semiconductor wafers with unparalleled accuracy and precision. The system utilizes advanced optical technology, including bright-field, dark-field and polarized imaging as well as spectral and lifetime measurements, to collect wafer-level data. These data are then used to analyze the performance of various wafer parameters, such as thickness, surface roughness, grain size, reflectance, scatter, and fluorescence. KLA P-6 is designed to work at both high and low production speeds, achieving up to 6,000 wafers per hour. In addition, the unit is equipped with dual-sided sensors, which allow it to gather data from two sides of a wafer simultaneously. As a result, twice as much data can be collected in half the time, enabling manufactures to cut costs and obtain faster results. TENCOR P6 is capable of multiple metrology techniques and offers both single-test and multi-test functionality. Single-test functionality allows users to select one specific test type (e.g. thickness) and use the machine to measure that test. Multi-test functionality, on the other hand, allows users to select multiple test types (e.g. thickness and grain size) and use the tool to measure all of them simultaneously. P6 offers a user-friendly interface, flexible configuration options, and robust reporting functions. The asset's intuitive control software guides users through procedure sequencing, allowing them to quickly and easily customize their testing requirements. In addition, the model includes a variety of specialized software applications for specific wafer metrology tasks. These applications enable users to quickly select the best metrology method for their application, create custom tests, and access critical results in real-time. KLA P6 also offers several value-added features that make it an invaluable tool. These include an advanced data logging equipment, an integrated wafer tracking system, automated wafer handling, and automated alignment for multi-site measurements. Combined, these features ensure the unit is easy to operate and can quickly and accurately provide users with the data they need. P-6 is an experienced and reliable wafer testing and metrology machine that is used in a variety of industries, including aerospace, fabrication, semiconductor, and electronics. It is a proven way to achieve accurate, repeatable and reliable measurements of thin films on semiconductors. With its cutting-edge technology, unparalleled accuracy and precision, flexible reporting functions, and real-time results, KLA / TENCOR P6 is an indispensable tool for any organization looking to improve their wafer testing and metrology applications.