Used KLA / TENCOR P-6 #9230786 for sale
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ID: 9230786
Vintage: 2012
Stylus profiler
Standard range: Microhead 5 SR
Sample stage area, 6" diameter
Vertical range: 327 µm
Force range: 0.5 mg to 50 mg
Scan length: 150 mm
Z Range: 1 mm
Does not include PC
2012 vintage.
KLA / TENCOR P-6 is an advanced wafer testing and metrology equipment designed to assess the quality control and performance of a wide range of wafers and substrates. It offers a comprehensive set of features and capabilities to ensure that wafers are produced to the highest standard. KLA P-6 system is capable of high-power optical inspection, measurement, and analysis of wafers up to 6" (150 mm) in diameter, and features a wafer handling unit that can be adapted to the changing needs of the manufacturing process. It is engineered for uniformity, accuracy, and repeatability, and has the ability to carry out both manual and automated operations. TENCOR P6 machine's integrated optical test technology utilizes high-resolution imaging and specialized optical lenses to inspect and analyze surfaces for defects and defects-related-non-uniformities. It also features a multi-channel metrology tool to enable a range of measurements on wafer surfaces and quantitative comparison of different wafer types. KLA / TENCOR P6 asset includes an Automated Visual Inspection (AVI) model for detecting surface imperfections and surface defects, along with advanced particle analysis capabilities. It also includes a comprehensive database of defect metrics, which can be used to quickly identify and locate any defects in wafers. The advanced control software of P-6 equipment is designed for ease of use and reliability, and features a flexible recipe-based system that allows the user to customize operations for changes in the wafer manufacturing process. It also includes a robust alarm unit that alerts users when non-conformances are detected, and allows for easy analysis of wafer properties. P6 machine features a wide range of other features such as automated handling and transport, integrated cleanroom, automation of wafer-level operations, and integrated precision calibration capabilities. It also includes several options and accessories to enable a customized solution to fit any workflow. Overall, KLA P6 wafer testing and metrology tool is an advanced, sophisticated asset that offers a comprehensive range of features and capabilities for measuring, testing and inspecting wafers and substrates. It is an ideal solution for manufacturers and organizations that require accurate, repeatable and reliable wafer testing results.
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