Used KLA / TENCOR P-7 #293665117 for sale

KLA / TENCOR P-7 is a wafer testing and metrology equipment developed for use in the fabrication of semiconductor components. It provides highly accurate analyses of wafers in order to optimize process control and yield. KLA P-7 combines high resolution imaging with powerful metrology capabilities for wafer measurements and defect inspection. The system features a modular design that allows for flexible configuration, allowing users to construct the unit that best fits their specifications and needs. Its motors and controllers provide a higher accuracy in motion control for improved repeatability of measurements. The software also enables automated wafer level testing to detect early process issues. TENCOR P 7 also offers improved imaging capabilities, including a variety of CCD detectors such as sCMOS and TDI, as well as a range of illumination options, including darkfield, brightfield, differential interference contrast (DIC), and Nomarski. These options can be combined to provide a higher accuracy in detection of subtle optical phenomena. To accurately measure patterns on the wafer, P-7 also features high-performance high resolution metrology capability, which is capable of measuring critical features down to 5nm. This enables accurate measurements of pattern pitches, critical dimensions, and other features that ensure device performance and reliability. P 7 also offers a combination of specialized sensors, scopes, spectroscopy, and specialized metrology modules to provide the most comprehensive set of tools for wafer measurement and defect inspection. This combination of technologies provides users with a complete solution for accurate wafer testing and analysis. Overall, KLA P 7 offers a powerful and versatile wafer testing and metrology machine designed to optimize process control, yield, and performance of semiconductor devices. Its combination of imaging, metrology, and specialized sensors and scopes provide users with an easy to configure tool that can accurately measure and inspect wafers.