Used KLA / TENCOR P1 #165277 for sale

KLA / TENCOR P1 is a state-of-the-art wafer testing and metrology equipment that facilitates the precise and efficient inspection, testing, and analysis of semiconductor wafers. The system can measure a wide range of wafer characteristics including wafer characteristics such as thickness, electrical resistance, optical reflectance and more. KLA P-1 is designed with a modular architecture allowing for a range of components such as scanners and probes to be integrated for a variety of wafer testing processes. The basic TENCOR P 1 unit is P1-V (Vision) machine, which is tailored for the testing of 2D elements such as dies and contact pads. TENCOR P1-G (GaDRS) tool is tailored for test of 3D elements such as deep trenches and connecting vias. KLA P 1-AM (Array Measurement) asset is suitable for wafer testing processes with high throughput requirements. The core technology of KLA P1 platform is its high-resolution imaging capability, which is based on automated multi-spectral imaging across multiple wavelengths. This allows for each wafer to be precisely analyzed and inspected, while the dynamic scanning allows for accurate measurements of multiple regions and with high throughput. Additionally, P-1 platform offers Giga-pixel Imaging to support industrial-level resolution for any array measurement applications. Various light sources can be integrated into the platform to support applications from 2D inspection, through to stereoscopic view of 3D elements. P 1 model also features advanced software for data acquisition, analysis and reporting. TENCOR P-1 software provides for maximum flexibility for wafer selection, handling and analysis. Many built-in features such as automation, database management, a graphical user interface (GUI) and image archive capabilities enable high throughput operations. To ensure maximum efficiency and accuracy, KLA / TENCOR P-1 equipment is supported by built-in sensors and closed-loop feeds for controlling, maintaining and adjusting device settings. Quality control and calibration processes can be easily implemented.The system also allows multiple probes and instruments to be connected, enabling easy parallel processes to be performed while measuring different parts of the same wafer. Overall, KLA / TENCOR P 1 platform is a powerful and reliable unit for the testing and metrology needs of the semiconductor industry. The high-resolution imaging, powerful software and automated sensors enable efficient, precise and reliable measurements. The modular design is also an attractive feature due to ease of integration, cost-effectiveness, and scalability.