Used KLA / TENCOR P1 #293590370 for sale

KLA / TENCOR P1 is an integrated metrology and wafer testing equipment designed to provide high-performance, single-wafer defect inspection and metrology for semiconductor and MEMS devices. The system combines a state-of-the-art optical imaging unit with a full suite of advanced, adaptive metrology tools to generate accurate, detailed data on a wide range of wafer structures and features. The machine enables rapid and effective inspection of hundreds of wafer structures and features on one test area, enabling chip manufacturers to identify and isolate defects for further analysis. KLA P-1's advanced optical imaging tool delivers excellent resolution of small features and structures on a single wafer. The asset's vibration damping enabled a high level of accuracy and repeatability across numerous images. The model is also highly adaptable, enabling the user to select a variety of light sources, magnifications, and spectral sensitivities to accommodate different wafer characteristics. TENCOR P 1 facilitates fast review and analysis of the electrical properties of defects and defect clusters acquired during the inspection process. The equipment combines two automatic positioning stages, which are combined with a static metrology stage. This allows the system to quickly and accurately map the position and size of multiple test sites to determine defect positions that can be reviewed and analyzed. Furthermore, the unit provides comparison of multiple wafers, enabling users to quickly and accurately identify trends across different wafer characteristics. Additionally, TENCOR P-1 offers advanced detection capabilities. Its multiple analytic tools can detect and characterize a wide range of defects and flaws associated with the electrical properties of components. Among these tools are advanced laser pulse chemistries and high-accuracy chemical formulations for pinpointing anomalous features and material deviations. Additionally, the machine features a unique set of sophisticated defect classifiers, which are embedded within the tool's algorithms, offering rapid and reliable detection of a nearly limitless range of wafer defects and flaws. In summary, P-1 is an integrated metrology and wafer testing asset designed to offer detailed data on a wide range of wafer structures and features. The model's superior optical imaging equipment and high accuracy metrology tools enable reliable identification and analysis of defects and defect clusters. Additionally, its advanced detection capabilities combine with the system's set of sophisticated defect classifiers to provide a near unlimited range of wafer defect detection and analysis.