Used KLA / TENCOR P1 #293608786 for sale

KLA / TENCOR P1 is an advanced wafer testing and metrology equipment designed for volume production of integrated circuit (IC) components. The system utilizes an automated direct imaging capability that provides high-accuracy, non-destructive analysis of numerous important parameters such as defect size, number, shape and type. The unit includes a suite of high-precision optical instruments and integrated software to allow efficient inspection of up to 28 silicon wafers in a single easy-to-use operation. The automated wafer inspection machine features three main components: Wafer Stage, Illumination Fixture and Image Processing Tool. The asset's Wafer Stage is capable of holding up to six stacked wafers and performs life-leveling operation for accurate placement of the wafer at the exact exposure point. The Illumination Fixture focuses the imaging light from three ergonomically positioned light sources in order to provide increased uniformity of illuminated fields over the wafer. The Image Processing Model acquires images and then processes them to measure various pre-defined chip parameters such as defect size, number, shape and type. The equipment also features advanced features such as high-speed wafer inspection, on-board video capability, and user-definable defect parameters. These features enable the system to inspect wafers quickly and accurately, reducing the time required for wafer inspection and analysis. Additionally, the unit's intuitive interface simplifies operation so that users can quickly and easily program inspections, analyze results and modify the machine settings to optimize throughput and accuracy. Additionally, KLA P-1 is equipped with systems qualification and process optimization tools. These tools provide an automated check of each tool component prior to each wafer inspection operation. This automated check helps ensure data accuracy and reliability by checking for error-free imaging operations. Additionally, the asset provides comprehensive reporting to help optimize product yield and process performance. Overall, TENCOR P 1 is an advanced wafer testing and metrology model designed for volume production of IC components. Its automated imaging capabilities and intuitive user interface to simplify operation and optimize throughput and accuracy. Additionally, its systems qualification and process optimization tools offer automated checking and reporting to improve product yield and process performance.