Used KLA / TENCOR P1 #9283641 for sale

KLA / TENCOR P1 is a wafer testing and metrology equipment, designed specifically to meet the needs of modern microelectronics factories. The system provides reliable, precision metrology results for a variety of semiconductor wafer technologies. It is powered by advanced illumination and detector technologies that enable fast, accurate and repeatable results at the wafer level. The unit combines an optical microscope to image and measure wafers, as well as a quadrant detector to provide wafer-level data with high accuracy and detail. By using a variety of inspection techniques such as interferometry, diffraction, optical profiling, image processing and multimodal scanning, KLA/TECNOR KLA P-1 performs truly comprehensive measurements and analysis. The machine features adjustable lighting with a featured 510 nm wavelength laser beam and a variable angle window which provides precise illumination and eliminates shadowing. Advanced 3-D PreSight Technology compensates for non-uniformity in the pattern illumination process, ensuring accuracy and repeatability in the results. TENCOR P 1 also features a one-of-a-kind optical metrology tool which can measure wafer thickness, surface roughness, step height, and flatness. With the asset preconfigured to measure over 5 different values of wafer topography and thickness, TENCOR/TECNOR TENCOR P1 minimizes the set-up time for wafer level measurements. In addition, KLA P1 also features a dual-view technology, which enables simultaneous wafer image acquisition and measurements in both the x and y direction. This is enabled by the model's special split-aperture mechanism, which provides a high level of field resolution. KLA / TENCOR P 1 provides a comprehensive, unified solution for wafer-level testing and metrology. Its unique imaging and metrology technologies enable accurate and repeatable results, while its adjustable lighting and dual-view capabilities provide additional advantages for this powerful and effective testing equipment.