Used KLA / TENCOR P1 #9386653 for sale

KLA / TENCOR P1 is a wafer testing and metrology equipment, from KLA Corporation, designed to provide advanced precision measurements and defect detection for a wide range of wafers and substrates. It utilizes both optical microscopy and high-resolution imaging technology for high precision sub-micron measurements. The system is capable of supporting wafer sizes between 2-7.5 inches (50.8 mm - 190.5 mm), with thickness ranging from 0.5 to 9.5 mm. The unit is designed to detect and measure the dimensions of defects on a wafer using both bright field and dark field microscopy images. This allows it to detect even extremely small defects, such as particles, scratches, pits, and deposition material. It is also equipped with high-resolution imaging capability, which allows for deep-dive analyses of wafers. This feature increases the capability of the machine to uncover and characterize both prototyping and low-yield defects. The tool is also equipped with a wafer-hold mechanism, which is designed for the protection of the wafer during measurement. It is equipped with a digital tilt stage, allowing for precise angles and precise measurements of the wafer and its defects. The asset also offers automation features such as pattern recognition and automation macros, allowing users to quickly and accurately measure a large number of wafers in a short amount of time. KLA P-1 is integrated with a host of acquisition software to further analyse and analyze the data gathered from the measurements. This analysis software offers sophisticated capabilities like 3D surface characterization, mapping and scanning of 2D images, defect analysis ramping, and defect density and sizing among others. The data can also be exported for sharing and further analysis in other systems. This model is able to reduce the total cost and time required to analyze large volumes of wafer samples. The equipment is also equipped with an intuitive user interface, which allows for easy operation and navigation. This makes it easy for both experienced users and those new to wafer testing and analysis to operate the system. The unit also complies with safety standards and protocols, ensuring that the measurements are taken within the specified safety limits. Overall, TENCOR P 1 is a highly accurate and feature-rich machine for recording, mapping, and measuring defects and other surface characteristics on substrates and wafers. It is designed for high precision measurements and defect detection, enabling users to analyze large amounts of data accurately and efficiently.