Used KLA / TENCOR P10 #293590380 for sale

KLA / TENCOR P10
ID: 293590380
Surface profiler.
KLA / TENCOR P10 is a wafer testing and metrology equipment designed for analyzing IC devices at the wafer level. Equipped with a three-axis serial interface, KLA P-10 offers high-precision data acquisition, rapid measurements, and automated services. Capable of detecting fault conditions and physical defects from 0.25μm to 0.75μm, this system can integrate into existing production lines. TENCOR P 10 unit includes four subsystems: Alignment, Measurement (Optics), Analysis, and WordNet tools. The Alignment subsystem provides advanced automatic alignment and background correction capabilities, allowing highly accurate alignment and trajectory measurements. The Measurement subsystem comprises an advanced polarization microscope, providing high signal-to-noise ratio and contrast enhancements. Furthermore, the machine is equipped with powerful image processing algorithms which minimize distortion effects while maintaining signal fidelity. The Analysis subsystem is built around a powerful signal analysis engine, allowing to identify and classify defects as small as 0.25μm. This subsystem is complemented by the WordNet software which ensures the proper classification of detected defects. The Tool Application Controller (SAC) also enables TENCOR P10 to provide advanced actions such as automatic setup and wafer-level diagnostics. Furthermore, the SAC is essential for integrating TENCOR P-10 into existing test systems. Built with robust and reliable technology, P10 is an essential tool for IC production lines. Its precision, accuracy and speed make it an ideal choice for defect identification and wafer testing. The asset's capabilities allow it to differentiate false defects from true defects, helping to ensure the highest quality of the final IC device.
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