Used KLA / TENCOR P10 #293643963 for sale

KLA / TENCOR P10 is a wafer testing and metrology equipment designed for use in semiconductor metrology and lithography. It uses proprietary 'multi-wavelength dense wavelength division multiplexing (MW-DWDM)' technology for combined optical metrology and defect inspection, enabling fast and accurate analysis of semiconductor lithography and metrology features. The core components of KLA P-10 are its two-dimensional (2D) adaptive scanning capabilities, high-sensitivity optical system and advanced analytical tools. The unit's 2D adaptive scanning, combined with MW-DWDM technology, enables fast and accurate spot-finding and wafer mapping of defect sites. The high-sensitivity detector makes it possible to reduce the volume of light needed to perform measurements, while the machine's advanced analytical tools and automated control software can quickly identify, evaluate and locate defects in samples. TENCOR P 10 also employes a proprietary polarized imaging tool to detect novel standoff anomalies and defects more accurately. This asset utilizes four optical lenses and a high-resolution complementary scan to identify subtle metrology and lithography defects. The polarized imaging model offers improved wafer coverage and helps reduce optical cross-talk. P 10's automated defect detection capabilities are integrated with KLA/TERNOC's 'MetCam' equipment, which helps detect, classify and separate defects from multiple layers in a single scan. MetCam's unique algorithms can accurately detect and classify defects and features, reducing expensive false alarm rates. KLA P10 also features an advanced optical metrology system, combining automatic focus and automated mapping capabilities for precise measurements and fast wafer mapping. The unit's efficient sample handling and optical machine make it possible to process multiple wafers in minutes, enabling efficient and economical data acquisition and analysis. KLA / TENCOR P-10 is adaptable to a variety of sample formats, making it ideal for use in a range of applications. Its modular, open architecture allows it to be scaled up or down to meet the needs of specific applications. KLA P 10 is designed to be cost-efficient, and its robust construction makes it reliable and durable. In conclusion, P-10 is a high-performance wafer testing and metrology tool that enables fast and accurate analysis of semiconductor lithography and metrology features. It offers advanced features, including robust defect detection, efficient sample handling, high-resolution optical metrology and automated control software for fast data acquisition and analysis. The asset's modular, adaptable design and low cost make it a great value for any semiconductor metrology and lithography application.