Used KLA / TENCOR P10 #293655524 for sale

KLA / TENCOR P10 Wafer Testing and Metrology Equipment is a state-of-the-art inspection and test instrument that enables high-speed yield and defect analysis of wafers. It offers top-of-the-line combination of wafer level defect review, high-speed wafer mapping and test measurements with superior data accuracy and resolution. The system includes a multi-beam optical microscope for precisely inspected images of the entire wafer surface in order to detect defects with very high resolution, as well as a high-speed wafer mapping unit to measure electrical properties such as sheet resistance, sheet capacitance and contact resistance of the wafer. KLA P-10 utilizes the latest in metrology technologies such as advanced Abbe lens design, piezo-actuated objective movement, and high-definition optical machine to deliver extremely detailed images with top-notch resolution. The multi-beam optical tool and the advanced computational tools enables TENCOR P 10 to detect and acquire the exact location of the defects on the wafer. The asset also offers both laser probe and liquid-based imaging capabilities to render unsurpassed precision of the defects with virtually no artifacts or distortions. KLA P10 also offers very high-speed measurements and automated wafer imaging that enable efficient analysis of large wafers. The model also features automated alignment that simplifies the entire process for inspecting multiple wafers in a single setup. The included software is easy to learn and use, and enables rapid, repeatable measurements as well as advanced analysis and reporting capabilities. KLA / TENCOR P 10 Wafer Testing and Metrology Equipment is a reliable, high-precision instrument for the most demanding semiconductor processes. Its advanced optics, high-speed measurement capability and user-friendly software make it an ideal choice for wafer inspection and testing in the production line, R&D, and advanced application development.