Used KLA / TENCOR P10 #293662984 for sale

KLA / TENCOR P10 is a wafer testing and metrology equipment designed to quickly and accurately measure and inspect semiconductor wafers and other substrates. It is integrated with advanced optics, hardware, and software for automated, non-contact metrology, inspection, and defect localization on a wide range of wafer and substrates. The system is capable of achieving highly accurate measurements and can be configured for various test applications such as measuring film thickness, surface topography, particle size, and composition. KLA P-10 utilizes advanced optics to capture images of a wafer or substrate. It employs a binocular imaging unit with three lasers and three infrared cameras to acquire precise 3-dimensional images of the wafer or substrate. The machine can then quickly evaluate and extract various measurements from the image, such as height, width, depth, surface profile, and film thickness. Additional capabilities include defect detection, line width measurement, overlay measurement, and Flat Space Inspection (FSI). TENCOR P 10 features an embedded touch-screen interface that provides an easy-to-use interface for programming and controlling the tool. The touchscreen also allows users to quickly access test reports and results. The asset also features an optional automated wafer handling model that enables the user to quickly switch between different substrates without having to manually re-align the optics. TENCOR P10 is highly configurable and supports a variety of power, speed, and resolution settings to suit a wide suite of testing and metrology needs. The equipment also features an advanced pattern recognition capability which provides detailed feedback on difficult to capture features, such as sub-micron features, contaminants, and other subtle defects. In conclusion, P 10 is an advanced wafer testing and metrology system designed to quickly and accurately measure and inspect semiconductor wafers and other substrates. It is equipped with advanced optics, and software for automated, non-contact metrology, inspection, and defect localization. The unit is highly configurable and supports a variety of power, speed, and resolution settings to suit a wide suite of testing and metrology needs.