Used KLA / TENCOR P10 #293665059 for sale

KLA / TENCOR P10 Wafer Testing and Metrology Equipment is an integrated, automated platform for wafer testing and metrology. The system is designed for fast, accurate analysis of thin wafers, and is capable of analyzing wafer thickness, uniformity, and other parameters down to sub-micron resolutions. The unit utilizes a combination of optical and x-ray technologies to measure parameter data in real-time, and allows for the capture and collection of data in highly-detailed visual formats. KLA P-10 Wafer Testing and Metrology Machine consists of three key components: the Test-X process unit, the Optical Station, and the X-ray Station. The Test-X unit is responsible for controlling the entire process of wafer testing. It allows for wafer-to-wafer tracking, and provides advanced wafer manipulation and handling. The Optical Station provides an in-line optical inspection with a high-resolution imaging tool and powerful algorithms for processing and analyzing data. The X-ray Station utilizes an x-ray analysis technology that can accurately measure thinnest micro structure layers and most complex topographies. TENCOR P 10 Wafer Testing and Metrology Asset offers a comprehensive suite of data analysis capabilities. It includes full-featured software that allows users to process and analyze data in a variety of formats, including 3D structural analysis, visualization, and reporting. Additionally, the model can be used for a range of applications, such as defect detection, yield analysis, product qualification, and metrology. The equipment is designed for high-throughput operations and can sample up to 8 wafers per minute. TENCOR P-10 Wafer Testing and Metrology System is engineered to deliver accurate, repeatable testing with a high degree of reliability. It includes an automated calibration unit to ensure that testing is consistently accurate across multiple studies, and the machine is designed to be compliant with ESD and other standards as required by industry and government. The tool comes equipped with a range of data storage and communications options. It includes an integrated data capture and reporting asset that allows for rapid data storage and access. Additionally, the model can be connected to other networks, and can be used as a platform for remote or automated control. Overall, KLA P 10 Wafer Testing and Metrology Equipment is an integrated, automated platform for wafer testing and metrology. It provides a range of features and capabilities that make it an ideal tool for testing thin wafers and measuring parameters with accuracy and precision.