Used KLA / TENCOR P10 #293750857 for sale

KLA / TENCOR P10 is a high-precision wafer testing and metrology equipment designed for the semiconductor industry. The system enables 3D die-to-die yield analysis, chip-level electrical measurements, image-based inspection and metrology. Through its proprietary technology, KLA P-10 provides analytics and detailed analysis of integrated circuit chips during the fabrication process. The unit consists of three main components - the metrology station, the test station and the die-level metrology station. The metrology station is built with four-axis scanning capabilities, enabling advanced surface and pattern analysis. This helps TENCOR P 10 capture high-resolution images of each die to generate an accurate three-dimensional map of the wafers. In addition to the metrology station, the test station can evaluate how well completed ICs perform in electrical and optical measurements. The advanced test station also offers rapid data collection of all electrical parameters, providing detailed characterization and electrical fault analysis. By combining the two stations, KLA P10 can quickly analyze wafer defects and quickly perform yield, process, and design analysis for wafer productions. The die-level metrology station further enhances the machine's capability by capturing images from a microscope with an advanced 4-axis vision tool. Using the microscope, KLA / TENCOR P-10 can measure each die one at a time, providing detailed analysis of features and defects. With integrated data collection, processing, and analysis, TENCOR P10 is designed to improve decision-making in automated semiconductor fabrication processes. By providing highly accurate wafer images and detailed die level analysis, the asset has become an industry standard for wafer testing and metrology. P10 pushes the boundaries on what is possible and helps to maximize wafer yields.