Used KLA / TENCOR P10 #293751408 for sale

KLA / TENCOR P10 is a wafer testing and metrology equipment. KLA P-10 is equipped with advanced wafer inspection and metrology technologies, making it an optimal choice for semiconductor manufacturers looking to reduce cost and improve product quality. TENCOR P 10 offers a full range of wafer inspection and metrology capabilities, including wafer topography, critical dimension (CD) measurement, multiple pattern overlay, imaging and defect detection. Wafers of up to 300 mm in size can be inspected and measured, with throughputs of up to 200 wafers-per-hour (wph). TENCOR P-10 is equipped with advanced automation systems, such as an advanced special-purpose hardware controller (ASPC) and an automated wafer-handling system (AWHS). An integrated wafer mapping and multiple-view metrology (MVM) unit allow for full wafer topological characterization, as well as high accuracy CD measurements. P10 offers a comprehensive image-processing machine. It provides high-speed image acquisition and accurate defect characterization at resolutions exceeding 5nm in feature width. An advanced digital signal processor (DSP) captures electrical measurements to ensure precise and accurate test control on each wafer. TENCOR P10 also has an integrated defect review tool, which can perform automatic defect classification according to the critical parameters. This asset enables intelligent defect disposition decision-making, that is traceable across products and batches. Overall, KLA P10 is a versatile and precise wafer testing and metrology model, that offers precise wafer topology characterization and reliable defect review. Its advanced technologies and automation capabilities make it a perfect choice for semiconductor manufacturers seeking to improve their production quality and lower costs.