Used KLA / TENCOR P10 #9211916 for sale

KLA / TENCOR P10 is a state-of-the-art wafer testing and metrology equipment. KLA P-10 system is a fully-automated high-speed unit that is designed to inspect and measure all surface and defect characteristics of wafers. The primary application of a TENCOR P 10 machine is for wafer fabrication, where it is used to analyze and inspect process changes during the wafer fabrication process. KLA / TENCOR P-10 tool can detect a wide variety of defects on wafer surfaces, including whole-die defects, fine particles, surface scratches, and grain boundaries. Additionally, KLA / TENCOR P 10 is equipped with a dual-axis micro-mirror array that can perform critical measurements on the wafer surface with high precision and accuracy. KLA P 10 asset is constructed using the latest coupled-electrode pressure sensor technology. The coupled-electrode pressure sensor technology offers ultra-low-force profiling capabilities, and enables KLA P10 model to measure the topography of the wafer surface with an accuracy of less than 5nm. The equipment is also equipped with an integrated detection system that uses 200nm/pixel resolution to detect and classify defects on the wafer surface. This detection unit utilizes post-processing techniques such as statistical process control (SPC) to further classify and isolate defects for analysis. TENCOR P-10 machine is also capable of performing a number of non-destructive testing (NDT) operations on the wafer surface. These non-destructive tests include thin-film thickness, sheet resistivity, wet-etching, ion beam mix, vapor-phase reaction, ellipsometry, and other surface properties tests. Additionally, the tool can be used to perform stress/strain measurements, such as surface de-embedding and real-time thermal imaging. P10 asset can also be equipped with a number of optional features, including automated defect review systems, process wanders, die-to-die repeatability, and automated defect classification. The model is also compatible with a range of robotic loading/unloading systems, as well as robotic Vision Systems. P 10 equipment is also capable of integrating with other factory automation systems. TENCOR P10 wafer testing and metrology system is an efficient and versatile unit that is ideally suited for wafer fabrications. The machine's advanced coupled-electrode pressure sensor technology and non-destructive testing capabilities make it the perfect choice for process development and production monitoring. The integrated detection tool and automated defect review systems make P-10 asset a must-have for any semiconductor fabrication facility.