Used KLA / TENCOR P10 #9233591 for sale

KLA / TENCOR P10
ID: 9233591
Profiler.
KLA / TENCOR P10 is a wafer testing and metrology equipment designed for high-throughput wafer measurement and defect inspection. With three-dimensional imaging technology, KLA P-10 can provide precise surface and depth analysis of thin-film structures, including measurements for height, resistivity, composition, micro-defects, and more. The system utilizes patented shape-based defect detection algorithms to detect minor irregularities even in challenging patterning processes. TENCOR P 10 features a compact design with a minimal footprint, and is capable of accommodating wafers with a diameter of up to 300mm. It is capable of measuring up to 300 wafers per hour, making it an ideal unit for high-throughput wafer fabrication. KLA P10 also comes with a variety of advanced analysis capabilities, including three-dimensional data display, 3D overlay analysis, and overlay error maps. This data can be used to quickly gel high-magnification results such as line width, to characterize and monitor lithography processes. P 10 also offers a host of features geared towards improving the accuracy of metrology results. The machine utilizes Automatic Focus Adjustment to ensure that data-collection points remain consistent and accurate. Further, OptiChart software allows for pattern segmentation and automated mapping of defects, with manual re-inspection also available when needed. TENCOR P-10 also boasts a non-destructive critical dimension metrology tool which allows for precise measurements of resistivity, composition, and more. The asset also features drift compensation software to counteract the effects of thermal effects and topology. KLA / TENCOR P-10 is a versatile model, offering a host of benchmarking and analysis capabilities. Its extraordinary low-cost-of-ownership and wide host of capabilities make it an ideal choice for semiconductor fabrication and materials analysis. P10 is an ideal choice for precision metrology and defect inspection in today's wafer fabrication environment.
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