Used KLA / TENCOR P10 #9243616 for sale

KLA / TENCOR P10 wafer testing and metrology equipment is an automated measurement solution designed to meet the needs of the semiconductor industry. This system is designed to provide fast, accurate, and repeatable measurements of wafers across many process steps. It is capable of measuring wafers with dimensions up to 200 mm in diameter and is ideal for processing both GaAs and Si wafers. KLA P-10's main components include a scanning stage, illumination source, detectors, analysis software, and a precision manipulator. The scanning stage is designed to provide high-speed scanning over a wide field of view, allowing for fast and accurate measurements. The illumination source is composed of powerful xenon lamps that provide uniform illumination settings across the entire wafer surface. The detectors are designed to detect thermal emissions from the illuminated wafer, allowing for greater accuracy in the measurements. The analysis software is user friendly and allows users to quickly identify defects in the wafer and take appropriate corrective action. Finally, the precision manipulator allows users to move the wafer into the right position for analysis and measurements. TENCOR P 10 provides greater productivity and accuracy by utilizing its high speed, automated Gantt operations and various tools that are designed to quickly analyze the surface of the wafer. Additionally, users are able to take advantage of automatic particle detection capabilities and a CCD checklist for improved accuracy, allowing them to quickly identify complex defects. KLA / TENCOR P-10 unit also offers integrated temperature and pressure controls that enable users to make measurements in a variety of hostile environments. Temperature and pressure can be accurately monitored, ensuring that each wafer is measured under optimal conditions at all times. P10 is designed to provide fast, accurate, and repeatable measurements of wafers. It combines an automated measurement platform with advanced illumination and detection technologies for greater efficiency and accuracy. This machine offers improved productivity, greater accuracy in measurements, and integrated temperature and pressure controls that enable users to make measurements in even the most hostile of environments.