Used KLA / TENCOR P10 #9261861 for sale

KLA / TENCOR P10 is a wafer testing and metrology equipment designed to rapidly inspect and measure the performance of semiconductor wafers. The system incorporates the latest advanced inspection and metrology technologies to provide high throughput and repeatable, accurate measurements. At the heart of KLA P-10 unit is a high-resolution image sensor, capable of capturing images with up to 500nm resolution. Combining the sensor with advanced signal processing algorithms, TENCOR P 10 is capable of rapidly and precisely detecting defects on the surface of wafers. In addition to finding surface defects, P-10 can also measure a wide variety of device and process parameters with extremely high accuracy. P10 also includes a range of measurement modules that extend the machine's capabilities. These include laser reflectometry, 3D optical metrology, and scanning electron microscope. These modules allow KLA / TENCOR P 10 to measure semiconductor features such as line widths, feature sizes, depth profiles, and contact angles with high accuracy. TENCOR P-10 also comes with a host of tools to streamline operations. These include a job manager, a defect inspection review tool, and a recipe editor, which allow users to create, modify and execute jobs quickly and easily. Furthermore, KLA P 10 is integrated with KLA Suite software, which provides powerful analytics tools for trend analysis and yield optimization. TENCOR P10 is designed for high-volume, high-yield, low-cost operation, and is suitable for production testing and process evaluation. By combining advanced inspection and metrology capabilities with ease-of-use, KLA / TENCOR P-10 is an ideal solution for efficient wafer testing and process control.