Used KLA / TENCOR P10 #9280590 for sale

KLA / TENCOR P10 is a highly advanced wafer testing and metrology equipment that provides automated non-destructive characterization and Fab-wide quality control. It is equipped with high speed measurement capabilities, and advanced metrology, inspection and test solutions for all types of semiconductor wafers. The system features advanced automation such as automated wafer topography, chemical mapping, and wafer-coding solutions, as well as automated part placement and defect inspection capabilities. It utilizes innovative acquisition technologies to gather data quickly and accurately while maintaining a high degree of speed and precision. KLA P-10 is powered by advanced optics, software, and sensing systems that can detect defects and monitor wafer performance throughout the production process. The unit is built to inspect and measure wafers from start to finish, allowing for immediate feedback and action on any issues that may arise. It is capable of running both analog and digital measurements simultaneously, and has an advanced NIMS (Non-destructive Integrity Monitoring Machine) that helps maintain process control and wafer integrity. The main advantages of TENCOR P 10 are its high accuracy, high throughput, and comprehensive data analysis capabilities. Its advanced wafer topography tool provides detailed measurements on a single chip, providing valuable insights into how the wafer's surface is performing. The asset is also capable of efficient defect detection and characterization, enabling faster resolution of issues in order to avoid costly downtime in production. Additionally, its automated wafer coding solutions enable quick and easy traceability of wafers throughout the fabrication process, helping ensure a complete understanding of each wafer's performance. P10 is a reliable and efficient wafer testing and metrology model that meets the most stringent requirements of the semiconductor industry. Its advanced automation capabilities and rapid data collection capabilities are among the top advantages of this equipment. KLA P10 offers users advanced imaging and analysis features that are capable of identifying possible defects before they can have an impact on the wafer surface, as well as helping to reduce errors, time spent on inspection, and ultimately downtime in production.