Used KLA / TENCOR P10 #9293254 for sale

KLA / TENCOR P10 is a wafer testing and metrology equipment with several key features. It is designed for industry-leading performance in line-scan wafer metrology applications. KLA P-10 is equipped with the latest generation of scanning technology and high-resolution imaging capability to ensure accuracy and reliability in its measurements. Utilizing a suite of optical and tactile technologies, TENCOR P 10 can measure a variety of critical device parameters across the full wafer surface, including surface profile, pattern profile, contamination, thin films, and photovoltaic properties. The system's optical microscopy capabilities allow for the measurement of wafer features down to the nanoscale, while its probe-scanning technology maintains the highest level of accuracy in its device measurements. P 10 includes a range of engineering tools, allowing users to customize their metrology processes and program custom algorithms for specialized applications. It also features an integrated data analysis platform for efficient data processing and analysis. The unit is engineered for extreme environments with a temperature operating range from 0°C to 80°C. TENCOR P10's advanced controls and high-resolution, precision optics make it ideal for metrology applications in the semiconductor industry. It's also suited for measuring micro-scale patterns with high throughput. P10 is highly reliable and efficient for measuring single, double-sided, and multi-layered structures, making it the perfect tool for inspecting wafers of all sizes and shapes. Equipped with precision laser detection technologies, KLA / TENCOR P 10 is capable of accurately measuring relative counts of pattern defects on wafers, as well as various other surface properties. The machine is self-calibrating and features low-power laser sources for minimal maintenance. KLA P10 also offers an integrated light spectrum analysis module for accurate, repeatable spectral results. P-10 is a comprehensive tool designed for industry-leading performance in wafer metrology applications, featuring high accuracy, reliability and precision. It is ideal for line-scan wafer measurement and test purposes in semiconductor manufacturing, offering various engineering tools for custom test and analysis, as well as integrated suite of optical and tactile technologies.