Used KLA / TENCOR P10 #9293513 for sale

KLA / TENCOR P10 is an advanced wafer testing and metrology equipment designed to enable the detection of microscopic test defects. It provides fast, accurate, and reliable measurements of physical wafer characteristics. The system combines the latest contactless and optical measurement technologies. It has been designed to meet advanced wafer process and measurement requirements such as semiconductor device production, microelectronics, and optical materials processing. KLA P-10 unit offers four levels of high accuracy and precision measurements. It features a reliable and precise sample interface, which helps in the accurate mapping of test defects. The machine also offers a high-speed automated motion control that is accurate within a few nanometers. It combines a variety of light sources, complex alignment systems, lenses, mirrors, and cameras. This allows it to precisely measure over a wide range of test characteristics, such as surface profiles, line widths, and above/below surface flaws. For optical measurement, TENCOR P 10 tool utilizes a variety of imaging and scanning techniques, including stereomicroscopy, polarimetry, and mirror profilometry. These techniques employ sophisticated equipment to generate detail images of the wafer surface. The asset is also equipped with a high-precision motorized rotation stage, which helps it accurately measure surfaces at selected angles. KLA P 10 model can be used for a wide range of wafer testing and metrology applications. These include failure analysis, characterization of integrated circuits, alignment of the overlay of ICs, and characterization of optical sensor systems. Moreover, the equipment offers high-resolution digital imaging with a high-fidelity signal-to-noise ratio, which is very useful for inspecting the fine surface and feature details of the wafer. This helps in the detection and analysis of tiny defects as well as the mapping of test patterns. Overall, P 10 wafer testing and metrology system is a powerful and reliable tool for accurate detection of test defects and measurement of physical characteristics of wafers. It combines the latest technologies with high accuracy and precision to ensure high-quality results.