Used KLA / TENCOR P10 #9293534 for sale

KLA / TENCOR P10 wafer testing and metrology equipment is an advanced metrology tool designed for precise measurement and analysis of semiconductor structures. It utilizes highly advanced optics and calculation, automated sample handling, and near-field spectroscopy techniques to enable the examination and analysis of advanced semiconductor structures. KLA P-10 provides powerful imaging capabilities in both macro and micro level, including 3D surface reconstruction, 3D image analysis, and high-resolution spectral imaging. The system can also be configured to detect a range of physical parameters, including electrical, thermal, mechanical, and optical properties. This allows for an extensive range of wafer level tests and measurements to be performed, such as stress, contact resistance, and defect inspection. The unit is also designed to be flexible to adaptive to the customer's specific needs, providing a range of tool configurations and interchangeable components. This includes a variety of precision sensors and probes which enable complex sample measurement and analysis. It also has an integrated sample chucking stage that ensures stable, repeatable grabbing and positioning of samples. Additionally, TENCOR P 10 machine features multiple wafer handling configurations for high throughput production. The modular design of TENCOR P10 tool enables greater accuracy and throughput while minimizing downtime. The flexible measurement and test capabilities provide a range of options for customizing the asset to particular customer requirements. Furthermore, advanced data management capabilities ensure that the customer has access to secure and reliable data to facilitate efficient quality control and manufacturing. In summary, P-10 is an advanced metrology tool for precise wafer testing and metrology, specifically designed for advanced semiconductor structures. It provides powerful imaging and analysis capabilities, flexible tool configurations, and advanced data management capabilities. As a result, it is an ideal solution for the testing and analysis of sophisticated semiconductor structures.