Used KLA / TENCOR P10 #9301895 for sale

KLA / TENCOR P10 is an automated wafer testing and metrology equipment designed to provide precise quantitative measurements of the electrical, mechanical, and optical properties of semiconductor wafers. This system utilizes multiple technologies such as Deep UV, Ion Beammetrology, X-ray and Scanning Electron Microscopy, in order to deliver accurate and reliable wafer testing results. KLA P-10 is equipped with an advanced imaging unit which allows it to perform non-destructive file images accurately and quickly. The core of TENCOR P 10 is its advanced imaging machine which can capture highly detailed images of each wafer surface. It utilizes three technologies to achieve this: Deep UV, Ion Beam, and X-ray. It utilizes a specialized lens for each of these technologies to increase the resolution of the images and improve their accuracy. The imaging tool is also equipped with a high-resolution camera which allows for detailed measurements to be taken. P-10 also features an automated wafer testing process. This is done by utilizing Scanning Electron Microscopy (SEM) technology. In SEM, an electron beam is used to scan the surface of the wafer and generate an image of the features on its surface. This image can then be used to analyze the material properties of the wafer, such as its electrical resistance, charge leakage properties, surface roughness, or radiographic thickness. KLA P10 is also able to perform a range of metrology measurements. These include critical layer thickness measurements, dopant depth measurements, and profile measurements. This enables the asset to provide detailed metrics for a variety of applications such as yield and reliability analysis, defect detection and analysis, and process control. In addition to its imaging capabilities, KLA / TENCOR P-10 also includes advanced software functions which enable the wafers to be monitored in production, enabling statistical process control and providing feedback for improving the manufacturing process. Overall, P10 is an automated wafer testing and metrology model with a highly advanced imaging equipment and automated wafer testing process. Its capabilities enable it to perform a wide range of highly accurate and reliable tests and measurements of semiconductor wafers, enabling it to provide valuable data for a variety of applications.