Used KLA / TENCOR P10 #9379237 for sale

KLA / TENCOR P10 is a wafer testing and metrology equipment that provides high throughput, configurable architecture and advanced applications for semiconductor manufacturing. It offers a comprehensive suite of applications including defect review, optical CD measurement, overlay alignment, and mask flatness measurement. With advanced scanning and metrology technology, KLA P-10 provides fast and accurate wafer measurements. It features a dedicated scanning system that enables scans with an accelerating speed of up to 1000 nanometers per second with an amplitude resolution of 5 nanometers. TENCOR P 10 offers maximum flexibility with software that can be tailored to individual customer requirements and process evaluation criteria. The unit's imaging capabilities allows for detailed defect characterization, pattern measurements and analysis, and measurement of temperatures through the wafers. It also has a wide field of view and high-resolution 3D tomographic imaging, allowing for detailed characterization of defects. Besides the scanning and metrology systems, P 10 machine has a library of pre-programmed applications that provide the ability to monitor and identify various process variations such as particle deposition, resistivity changes, gas accumulation, and feature variation. The sophisticated, user-friendly applications and powerful results analysis increases yield and reliability for customers. A key feature of KLA P 10 is its built-in environmental control tool which monitors the environment of the asset on a regular basis. This helps to prevent outliers and false readings due to fluctuations in temperature and humidity. KLA / TENCOR P 10 also includes a comprehensive range of software and algorithms for quality assurance. It offers a variety of tools such as statistical analysis methods, defect identification approaches, software for recognizing process variations, and software for improving measurement accuracy. P-10 model is suitable for both R&D and volume production applications. It is powered by KLA proprietary WSA software (Wafer Section Analyzer) which is designed to enable fast, accurate, and repeatable wafer measurements. With its extended range of capabilities, the equipment offers the utmost reliability and quality control for customers.