Used KLA / TENCOR P10 #9399254 for sale

KLA / TENCOR P10 is a high precision wafer testing and metrology equipment designed for advanced material characterization and process and defect monitoring. The system is designed for scanning electron microscope (SEM) and focused ion beam (FIB) mapping applications of semiconductor devices, integrated circuits, and other materials. KLA P-10 unit combines sophisticated imaging, automated sectioning, high-resolution deposition, and comprehensive imaging and characterization capabilities to enable comprehensive wafer inspection and analysis. The machine includes a range of integrated technologies such as nano-scale resolution scanning tunneling microscopy, atomic force microscopy, Raman spectroscopy, and chemical imaging. This advanced tool provides rapid and accurate measurement of device properties such as topography, defect geometry, planarity, depth, and chemical composition. The asset offers a range of automated capabilities that are ideal for measurements such as automatic focal height and focus position control, as well as defect optimization. Additionally, the model features an extensive metrology suite for automated wafer-level defect analysis. TENCOR P 10 has advanced software tools for the analysis and reporting of measurement results. An intuitive graphical user interface enables the user to quickly view, analyze and manipulate the data. Automated tools simplify the task of extracting quantitative metrology data from images. An extensive set of analysis algorithms enables the equipment to identify and classify various patterns, features, and defects in the image. The system is capable of capturing images with resolution up to 1 micron and measuring thickness as small as 2nm. It has a high-precision positioning unit that enables the specimen to be quickly aligned and focused. Additionally, the machine is compatible with a wide range of substrates and materials, including semiconductor materials, quartz, sapphire, and glass. In summary, the advanced design and sophisticated technology of KLA / TENCOR P 10 tool enables the user to quickly and accurately analyze integrated circuits and other materials. The asset offers high resolution imaging, automated sectioning, and comprehensive wafer inspection and analysis capabilities. Comprehensive software tools enable the user to easily view, analyze, and manipulate the data for more effective measurement and analysis. This high precision model is well-suited for a wide range of material characterization and process and defect monitoring applications.