Used KLA / TENCOR P10 #9410631 for sale

KLA / TENCOR P10 Wafer Testing and Metrology Equipment is a high-performance wafer inspection and metrology tool designed to reduce manufacturing defects and yield losses. The system utilizes automated optical inspection and metrology technologies to identify, classify, and size-measure features on semiconductor wafers. The unit consists of an advanced, double-sided inspection and measurement tool that is capable of quickly scanning and analyzing micro-cavities, TSV, and Bond Pads and other features on the substrate. KLA P-10 machine employs a wide array of imaging systems and technologies, including scatterometry, bright field, and darkfield imaging, to quickly and accurately identify and locate product defects, like missing spots, line defects, and pinholes before they can reach the end product. All images are stored in an S3-based image archiving tool for easy retrieval and review. TENCOR P 10 also includes an auto-classification algorithm with the ability to detect shapes, text perimeters and defects. This algorithm allows a user to quickly categorize features based on size, shape and location. For example, it can identify line widths, contact voids, and pinholes. The asset can also be integrated with other KLA systems to expedite the identification and reporting of product defects. TENCOR P10 model is also equipped with a number of metrology capabilities, including film thickness measurement and repeatability, linewidth detection, and geometry measurements. Film thickness measurement is accomplished using an automated multi-angle ellipsometer and analyzer. Using this equipment, precision measurements of thin- and thick-film materials can be acquired quickly with high precision. Linewidth and critical dimension measurements are acquired using an automated system of laser scanning interferometers. This unit is capable of measuring line widths and other dimensional attributes on a wide variety of wafer surfaces. For geometry measurements, TENCOR P-10 machine is equipped with a laser-based tool that is capable of measuring the edges and profiles of wafers. KLA P10 Wafer Testing and Metrology Asset is also equipped with a comprehensive data management model, allowing users to access and analyze data quickly. The equipment is also compatible with different fabrication tools, as well as other test equipment, allowing it to be tailored to the needs of different clients. Overall, KLA / TENCOR P-10 system is a powerful and reliable tool that can help reduce defects and improve yields in the semiconductor manufacturing process. The unit offers a range of features and capabilities, allowing users to quickly and accurately detect, classify, and size-measure defects on semiconductor wafers with improved efficiency.