Used KLA / TENCOR P10 #9412713 for sale

ID: 9412713
Surface profiler With computer Monitor.
KLA / TENCOR P10 is a fully automated wafer testing and metrology equipment that offers comprehensive metrology capabilities. It can measure the electrical properties of individual wafers and semiconductor packages with high precision and accuracy. KLA P-10 wafer testing and metrology system includes a variety of instruments and components that are associated with the electrical properties of a wafer. For example, TENCOR P 10 offers a combination of optical and electrical characterization instruments, as well as critical dimension measurement capabilities. The unit supports a range of electrical specifications, including current, voltage, resistance, capacitance and inductance. P10 is designed to improve the yield of advanced semiconductor and electronic products by quickly identifying defects and minimizing wafer and package retesting. As such, it is an effective tool for managing and improving the yield of high value semiconductor products. The machine features advanced resolution imaging capabilities, high speed testing over multiple sites, and proprietary testing algorithms. Its wafer handling tool accommodates various lot sizes and provides superior repeatability and uniformity. TENCOR P-10 also supports high throughput data acquisition and monitoring through a LiDAR asset, allowing users to identify and isolate parts that need to be retested faster. Its data can be collected and analyzed in real time. In addition, KLA P 10's metrology capabilities are supported by an industry leading software package that allows users to interpret their results accurately and quickly. This software helps users to quickly identify electrical anomalies and other defects that may be present on the wafer or package. P 10 is designed for maximum versatility and reliability. Its integrated software and hardware are developed to support a wide range of applications and processes, including testing for restrictive defect location and identification, defect density measurements, low-k characterization and 3D stacked wafer analysis. Each of these features contributes to reducing the time for production and ensuring that the highest level of product quality is achieved. It is also capable of meeting the unique requirements of each customer by providing custom designs and more extensive analytical capabilities. P-10 is an ideal wafer testing and metrology solution for semiconductor manufacturers. It is designed to help these companies optimize their operations, improve yields and reduce costs by providing an automated testing and metrology model that reduces retesting and ensures high quality parts. With KLA / TENCOR P-10, semiconductor manufacturers can quickly and accurately diagnose issues with their wafers or packages, saving time and money while ensuring the highest level of quality.
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