Used KLA / TENCOR P11 #293593192 for sale

KLA / TENCOR P11 is a wafer testing and metrology equipment designed to measure the physical and electrical characteristics of semiconductor wafers. The system allows operators to quickly and accurately capture comprehensive data on feature geometry, optical properties, and electrical characteristics. KLA P-11 features advanced positioning and intensifier technologies, enabling precise measurement across multiple chips. In terms of physical features, TENCOR P 11 makes use of traditional interferometric imaging techniques, allowing precise geometric characterization of features on the wafer against a wide range of parameters. High-resolution imaging and precise focus servicing allow precise 3-dimensional measurements to be captured. Through state-of-the-art video microscopy techniques, users are also able to identify and isolate abnormalities or defects on the wafer. The unit allows for 10 micron measurement resolution, facilitating accurate metrology across a wide range of samples. In terms of electrical characterization, TENCOR P11 is equipped with a variety of devices such as probes, reflective probes, beam detectors, and voltage contrast microscopes. These capture and measure electrical characteristics at the chip level, including the operating power and frequency of the circuits, the performance of devices, and the functionality of transistors. P11 also allows for accurate electrical testing of devices, including resistance measurement and current leakage. Automatic calibration and self-learning algorithms allow for improved accuracy and repeatability. P 11 offers enhanced automation capabilities to reduce human errors, improve throughput, and efficiently process large batches of wafers. Through its powerful analytics, KLA P11 can process many wafers at once, allowing manufacturers to quickly identify outliers or potential strains. Comprehensive data acquisition and wafer registration capabilities allow KLA P 11 to store data and quickly analyze it to generate reports. P-11 is a powerful tool for advanced testing and metrology of semiconductor wafers. With its advanced imaging and electrical characterization capabilities, the machine can quickly and accurately analyze samples, allowing for improved yields and high-quality devices.