Used KLA / TENCOR P11 #293644735 for sale

ID: 293644735
Surface profiler.
KLA / TENCOR P11 is a wafer testing and metrology equipment. The system is designed to measure the performance of semiconductor devices on a single wafer. The unit consists of three components; a probes, measurement modules, and a communication interface. KLA P-11's probes are designed to contact the surface of a wafer in order to measure the electrical characteristics of the devices on each of its individual sites. The probes come in various models that allow for the wafer to be tested for a variety of electrical properties, such as resistance and capacitance. The probes are capable of testing up to 8 electrical properties at once, giving users a complete electrical profile of their wafers. The measurement modules are responsible for collecting the data acquired by the probes and translating it into a readable format. The measurement modules are connected to the probe machine and are used to monitor each individual device on the wafer. They are equipped with an array of algorithms that can detect and analyze any deficiencies according to the parameters set by the user. TENCOR P 11's communication interface is what allows users to access the data they've collected from their probes. The interface is based on a LAN network, allowing users to access their data from virtually any location. The interface also allows users to view data trends and analyze them in various ways. This can help them in making decisions about their devices, or even in troubleshooting a wafer with known defects. All of these components coupled together result in a powerful wafer testing and metrology tool that can give users a comprehensive view of the electrical performance of their devices. With its combination of probes, measurement modules and a communication interface KLA / TENCOR P-11 provides users with a complete solution for analyzing and optimizing their wafers.
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