Used KLA / TENCOR P11 #293661312 for sale

KLA / TENCOR P11 is a wafer testing and metrology equipment designed to improve wafer-level test experience in semiconductor fabrication. This instrument combines the leading edge technology of its predecessor P10 with the advanced capabilities of its larger P15 system. It allows a single unit to accommodate a range of wafers from 6" to 12" while maintaining superior FTIR (Fourier Transform Infra-Red) analysis and high-fidelity signal capture. Its high accuracy, throughput, and usability make it a powerful tool for both wafer-level test and metrology applications. KLA P-11 implements its groundbreaking photodiode array (PDA) technology to capture and digest data from as many as forty-four photodiode sites in a single full-wafer measurement. Each photodiode in this array is individually configured to acquire signals with maximum fidelity and accuracy. This result is a comprehensive measurement with relative and absolute data correlation across multiple locations providing superior accuracy and fewer test iterations. TENCOR P 11's FTIR capabilities coupled with its PDA technology can detect even the most subtle variations in test structures and performance parameters. This allows it to acquire highly precise data for complex signal and noise analysis in both manual and automated test/metrology scenarios. Process Control systems are also available with KLA / TENCOR P 11 to provide greater control over wafer test sequences and timing. This ensures flexible, high-precision execution of wafer testing operations made possible by the Instrument control language (ICL) program set. To increase the performance and accuracy of KLA / TENCOR P-11 and preserve accuracy over time, proprietary optical techniques are used to compensate for hardware variability. Autonomous monitoring and controls also allow for dynamic adjustment of optical parameters to maintain highly accurate responses for a number of different tests. P11's enhanced processing and advanced optics provide the user with advanced data capture, precise waveform measurements, real-time signal analysis, and a range of other features. Overall, the machine provides superior data accuracy, fast measurement times, and operational efficiencies for both test and metrology applications, making it an ideal choice for the most demanding semiconductor fabrication operations.